Investigation of various phases of Fe–Si structures formed in Si by low energy Fe ion implantation

作者: Wickramaarachchige J. Lakshantha , Mangal S. Dhoubhadel , Tilo Reinert , Floyd D. McDaniel , Bibhudutta Rout

DOI: 10.1016/J.NIMB.2015.07.037

关键词:

摘要: … For the as-implanted samples, XPS shows formation of α-FeSi 2 structures in the samples. The Fe 2p 3/2 peak was positioned at the binding energy of 707.2 eV with the asymmetric …

参考文章(23)
T.H Yang, Y.L Chueh, H.C Chen, L.J Chen, L.J Chou, Auto-correlation function analysis of phase formation in iron ion-implanted amorphous silicon layers Thin Solid Films. ,vol. 461, pp. 126- 130 ,(2004) , 10.1016/J.TSF.2004.02.085
Bibhudutta Rout, Mangal S. Dhoubhadel, Prakash R. Poudel, Venkata C. Kummari, Bimal Pandey, Naresh T. Deoli, Wickramaarachchige J. Lakshantha, Stephen J. Mulware, Jacob Baxley, Jack E. Manuel, Jose L. Pacheco, Szabolcs Szilasi, Duncan L. Weathers, Tilo Reinert, Gary A. Glass, Jerry L. Duggan, Floyd D. McDaniel, An overview of the facilities, activities, and developments at the University of North Texas Ion Beam Modification and Analysis Laboratory (IBMAL) RADIATION PHYSICS: IX International Symposium on Radiation Physics. ,vol. 1544, pp. 11- 18 ,(2013) , 10.1063/1.4813454
H. Reuther, E. Wieser, D. Panknin, R. Grötzschel, W. Skorupa, G. Querner, Investigation of ion beam synthesized iron silicide by RBS, XRD, and Mössbauer spectroscopy (CEMS) Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms. ,vol. 68, pp. 241- 244 ,(1992) , 10.1016/0168-583X(92)96084-C
S Doniach, M Sunjic, Many-electron singularity in X-ray photoemission and X-ray line spectra from metals Journal of Physics C: Solid State Physics. ,vol. 3, pp. 285- 291 ,(1970) , 10.1088/0022-3719/3/2/010
Yoshihito Maeda, Kentaro Nishimura, Takahito Nakajima, Bui Matsukura, Kazumasa Narumi, Seiji Sakai, Enhancement of IR light emission from β‐FeSi2 nanocrystals embedded in Si Physica Status Solidi (c). ,vol. 9, pp. 1888- 1891 ,(2012) , 10.1002/PSSC.201200072
C. D. Wagner, L. E. Davis, M. V. Zeller, J. A. Taylor, R. H. Raymond, L. H. Gale, Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis Surface and Interface Analysis. ,vol. 3, pp. 211- 225 ,(1981) , 10.1002/SIA.740030506
J.C.W. Folmer, D.K.G. de Boer, XPS core level line shapes in metallic compounds: A probe for the nature of the electrons at the Fermi level Solid State Communications. ,vol. 38, pp. 1135- 1138 ,(1981) , 10.1016/0038-1098(81)90973-X
Sven Tougaard, Quantitative analysis of the inelastic background in surface electron spectroscopy Surface and Interface Analysis. ,vol. 11, pp. 453- 472 ,(1988) , 10.1002/SIA.740110902
M. Milosavljević, G. Shao, N. Bibić, C. N. McKinty, C. Jeynes, K. P. Homewood, Amorphous-iron disilicide: A promising semiconductor Applied Physics Letters. ,vol. 79, pp. 1438- 1440 ,(2001) , 10.1063/1.1400760