作者: G. Lorang , M. Da Cunha Belo , A. M. P. Simões , M. G. S. Ferreira
DOI: 10.1149/1.2059338
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摘要: Chemical characterization of passive films formed on AISI 304 austenitic stainless steel, in a borate/boric acid solution at pH 9.2, under various conditions potential, temperature, and polarizations time, was made by Auger electron spectroscopy combined with ion sputtering, x-ray photoelectron (XPS). The depth chemical composition, thickness, duplex character the layers were determined after processing AES sputter profiles their quantitative approach based sequential layer sputtering model. Moreover, separated contributions elements oxidized unoxidized state could be disclosed from part to oxide-alloy interface. XPS study specified bondings which take placed inside film, between Fe oxygen (and water).