An Effective Test Generation System for Sequential Circuits
作者： Ralph Marlett
关键词:
摘要: This paper describes a test generation system capable of high fault coverage in complex sequential circuits. Sequential logic is efficiently processed by unidirectional time flow approach. single path sensitization technique dynamically expands to multi-path reconvergent fan-out structures. Sophisticated conflict analysis used reduce back-tracking. User guidance also accepted further improve performance.
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