Fault tolerant Four-State Logic by using Self-Healing Cells

作者: Thomas Panhofer , Werner Friesenbichler , Martin Delvai

DOI: 10.1109/ICCD.2008.4751832

关键词:

摘要: The trend towards higher integration and faster operating speed leads to decreasing feature sizes lower supply voltages in modern integrated circuits. These properties make the circuits more error-prone, requiring a fault tolerant implementation for applications demanding high reliability, e.g. space missions. In previous work we presented concept how obtain digital by using asynchronous four-state logic (FSL). This type of already exhibits degree tolerance where most faults simply halt circuit (deadlock). remaining types are handled temporal redundancy. Adding deadlock detection unit introducing self-healing cells (SHCs) highly reliable that is able tolerate even multiple faults. However our experiments revealed some specific constellations neither cause nor they detected redundant calculation. We present two improved ways error detection, which allow capture these Further, comparison between size an SHC achieved wrt. performed.

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