Surface plasmon resonances at a [Ag/SiO2 helical thin-film] interface
作者： Ji Bum Kim , Pazhanisami Peranantham , Yu Seok Shin , Chang Kwon Hwangbo , Yu Zou
DOI: 10.3938/JKPS.60.1249
关键词:
摘要: Multiple surface plasmon resonances (SPRs) were observed in the [prism/Ag/SiO2 helical thin-film] Kretschmann configuration with a p-polarized incident beam. Simulation shows that multiple SPRs occur only for SiO2 film thicknesses greater than period of 307 nm. Experimental results are good agreement simulated results. may have more capabilities sensing chemical and biological species conventional single SPR.
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