Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nanocircuit at very low temperature
作者： Hervé Courtois , Julien Senzier , Pengshun Luo
DOI: 10.1063/1.2436651
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摘要: The authors demonstrate the combination of scanning force microscopy and tunneling spectroscopy in a local probe microscope operating at very low temperature (60mK). This uses quartz tuning fork ensuring high tunnel junction stability. They performed spatially resolved spectroscopic study superconducting nanocircuit patterned on an insulating substrate. Significant deviations from theoretical prediction are observed.
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sci-hub.st 参考文章(14)
N. Moussy, H. Courtois, B. Pannetier, A very low temperature scanning tunneling microscope for the local spectroscopy of mesoscopic structures Review of Scientific Instruments. ,vol. 72, pp. 128- 131 ,(2001) , 10.1063/1.1331328
L. Crétinon, A. K. Gupta, H. Sellier, F. Lefloch, M. Fauré, A. Buzdin, H. Courtois, Scanning tunneling spectroscopy of the superconducting proximity effect in a diluted ferromagnetic alloy Physical Review B. ,vol. 72, pp. 024511- ,(2005) , 10.1103/PHYSREVB.72.024511
Wolfgang Wernsdorfer, M. Faucher, B. Pannetier, V. Bouchiat, Christophe Thirion, T. Fournier, Josephson junctions and superconducting quantum interference devices made by local oxidation of niobium ultrathin films Applied Physics Letters. ,vol. 79, pp. 123- 125 ,(2001) , 10.1063/1.1382626
C. Veauvy, K. Hasselbach, D. Mailly, Scanning μ-superconduction quantum interference device force microscope Review of Scientific Instruments. ,vol. 73, pp. 3825- 3830 ,(2002) , 10.1063/1.1515384
P. G�nther, U. Ch. Fischer, K. Dransfeld, Scanning near-field acoustic microscopy Applied Physics B. ,vol. 48, pp. 89- 92 ,(1989) , 10.1007/BF00694423
H. Pothier, S. Guéron, Norman O. Birge, D. Esteve, M. H. Devoret, Energy distribution function of quasiparticles in mesoscopic wires Physical Review Letters. ,vol. 79, pp. 3490- 3493 ,(1997) , 10.1103/PHYSREVLETT.79.3490
Franz J. Giessibl, Advances in atomic force microscopy Reviews of Modern Physics. ,vol. 75, pp. 949- 983 ,(2003) , 10.1103/REVMODPHYS.75.949
D. C. Glattli, P. Jacques, A. Kumar, P. Pari, L. Saminadayar, A noise detection scheme with 10 mK noise temperature resolution for semiconductor single electron tunneling devices Journal of Applied Physics. ,vol. 81, pp. 7350- 7356 ,(1997) , 10.1063/1.365332
Khaled Karrai, Robert D. Grober, Piezoelectric tip‐sample distance control for near field optical microscopes Applied Physics Letters. ,vol. 66, pp. 1842- 1844 ,(1995) , 10.1063/1.113340
Robert D. Grober, Jason Acimovic, Jim Schuck, Dan Hessman, Peter J. Kindlemann, Joao Hespanha, A. Stephen Morse, Khaled Karrai, Ingo Tiemann, Stephan Manus, Fundamental limits to force detection using quartz tuning forks Review of Scientific Instruments. ,vol. 71, pp. 2776- 2780 ,(2000) , 10.1063/1.1150691