Atomic resolution Z-contrast imaging of interfaces

摘要: Abstract Z -contrast imaging of crystals at a major zone axis is accurately described as convolution the scanning probe intensity profile with an object function sharply peaked each atomic column. The contains high-angle scattering cross sections and all dynamical diffraction effects, which manifest simply channeling effect for individual can be entirely using highly localized s -type Bloch states. A tight binding formulation shows clearly that neighboring columns considered independently, in case no proximity effects occur interfaces, its possible to assemble functions superlattices or complex unit cells from appropriate isolated string strengths may calculated simpler model cells. Channeling are always less sensitive column composition than sections. Therefore, corrections image second order, first order intuitive interpretation obtained directly image, priori assumptions on likely interfacial arrangements. These ideas will illustrated Si m Ge n (YBa 2 Cu 3 O 7− x ) (PrBa .