Resolving stress tensor components in space from polarized Raman spectra: polycrystalline alumina

作者: Giuseppe Pezzotti , Wenliang Zhu

DOI: 10.1039/C4CP04244A

关键词:

摘要: A method of Raman spectroscopic analysis has been proposed for evaluating tensorial stress fields stored in corundum-structure alumina polycrystals.

参考文章(45)
F GRELLNER, S HOSCHELER, P GREIL, J SINDEL, A PETSCHELT, Residual stress measurements of computer aided design/computer aided manufacturing (CAD/CAM) machined dental ceramics Journal of Materials Science. ,vol. 32, pp. 6235- 6242 ,(1997) , 10.1023/A:1018633026519
R. S. Krishnan, Raman spectrum of alumina and the luminescence of ruby Proceedings of the Indian Academy of Sciences - Section A. ,vol. 26, pp. 450- 459 ,(1947) , 10.1007/BF03170901
Shigehiro Ohtsuka, Wenliang Zhu, Shigemi Tochino, Yutaka Sekiguchi, Giuseppe Pezzotti, In-depth analysis of residual stress in an alumina coating on silicon nitride substrate using confocal Raman piezo-spectroscopy Acta Materialia. ,vol. 55, pp. 1129- 1135 ,(2007) , 10.1016/J.ACTAMAT.2006.05.038
Giuseppe Pezzotti, Keisuke Okai, Wenliang Zhu, Stress tensor dependence of the polarized Raman spectrum of tetragonal barium titanate Journal of Applied Physics. ,vol. 111, pp. 013504- ,(2012) , 10.1063/1.3672833
Giuseppe Pezzotti, Raman spectroscopy of piezoelectrics Journal of Applied Physics. ,vol. 113, pp. 211301- ,(2013) , 10.1063/1.4803740
Derek J. Gardiner, Michael Bowden, Samuel H. Margueron, David R. Clarke, Use of polarization in imaging the residual stresses in polycrystalline alumina films Acta Materialia. ,vol. 55, pp. 3431- 3436 ,(2007) , 10.1016/J.ACTAMAT.2007.01.044