Deuterium Trapping in Rolled Polycrystalline Tungsten Exposed to Low Energy Plasma

摘要: Deuterium retention after low energy plasma exposure was investigated using the polycrystalline tungsten samples of which grain elongation directions are parallel and perpendicular with respect to surface. The deuterium calculated from TDS spectra is 2-10 times larger in sample direction than one for irradiation temperatures 450-750K. Removing anisotropy by recrystallization resulted disappearance difference both kinds samples. No bubbles no blisters have been observed near surface layer Plasma should produce high defects that responsible retention. seems be attributed different effective diffusion coefficients depending on direction. c