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摘要: A description is given of a multiple beam interferometric procedure which can be used as powerful method for revealing the details surface topography approximately flat crystal planes. The optical conditions are critical and discussed. Details structure revealed cannot detected by microscope or goniometer. interference fringes employed either in transmission reflexion, latter type being well suited examination translucent opaque crystals. Face angles, between small faces large faces, no more than 1/50th minute arc measured.* topographical features highly lustrous (100) face left-handed quartz studied this procedure. Large vicinal inclined at angles varying from 0.50 to 9.00 min. arc, found cover face. surfaces most these curved, with radii curvature 20 60 m. some contact vary considerably along length common edge. characteristic visual markings face, namely striations, / marks triangles, reveal their influence upon fringe patterns determined. striations shown ridges ruts, height depth only 100 (20 silica molecules). discontinuities level neighbourhood. triangular submicroscopic tetrahedral projections 450 (90 molecules), order 2 3 nature experimental described considered function region intermediate X-rays.