Interface test adapter for actively testing an integrated circuit chip package

摘要: A Test Adapter for actively testing chip package such as a ball grid array in operation with printed circuit board are disclosed. The test adapter provides accessible points monitoring input and output signals of an operating package. includes interface having plurality contact pads disposed on its surface, pattern corresponding to the footprint terminals protrude from bottom connected upper configured engage receiving socket mounted board. pins also that probes can be input/output associated monitored by probes.