摘要: The selection of particles suitable for high-resolution cryo-EM structure determination from noisy micrographs may represent a tedious and time-consuming step. Here, semi-automated particle procedure is presented that has been implemented within the open-source software RELION. At heart lies fully CTF-corrected template-based picking algorithm, which supplemented by fast sorting algorithm reference-free 2D class averaging to remove false positives. With only limited user-interaction, proposed yields results are comparable manual selection. Together with an improved graphical user interface, these developments further contribute turning RELION stand-alone refinement program into convenient image processing pipeline entire single-particle approach.
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