Characterization of Zirconium Phosphate/Polycation Thin Films Grown by Sequential Adsorption Reactions
作者： Hyuk-Nyun Kim , Steven W. Keller , Thomas E. Mallouk , Johannes Schmitt , Gero Decher
DOI: 10.1021/CM970027Q
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摘要: … measured with a Nicolet 730 FT-IR spectrometer, which had … Samples for FT-IR measurements were prepared on 1 in. × 1 … by reflection−absorption FT-IR spectroscopy. Figure 7 shows …
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