作者: L Luo , Y.G Gong , S.M Gong , S.H Hu
DOI: 10.1016/S0167-577X(97)00279-6
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摘要: Abstract The solid-state diffusion behavior in the layered Cu–Sn/Cu intermetallic phase system was investigated by using Cu–20 wt.% Nb (filament)/Sn couple at 400–450°C. Very thin filament is used as an inert marker for studying Kirkendall effect-like phenomena. Experimental results show that filaments near interface of Cu–Nb/Sn are shifting toward Cu–Nb side and forming a aggregating zone with concentration up to 27–40 width about 10–15 μm. study proved shift originated from volume expansion caused formation e (Cu3Sn). convoluting or coarsening ribbon-like resulting stress relaxation during annealing plays role driving force aggregation Nb, making density dependent on temperature.