作者: P. H. Gaskell , David J. Smith
DOI: 10.1111/J.1365-2818.1980.TB04077.X
关键词:
摘要: SUMMARY A number of amorphous and partially crystalline palladium-silicon alloys have been examined by high resolution transmission electron microscopy at 500 kV. With the directly interpretable extending beyond first peak in structure factor 0ṁ23 nm, details local microstructure atomic level are visible. Images small metallic particles show a well-defined pattern fringes over regions. In some instances, especially partially-ordered alloys, neighbouring or overlapping fringe patterns appear to be orientationally-related similar manner systems seen symmetrically multiply-twinned particles. The significance this type structural examination for metals is discussed.