作者: J. Petermann , H. Gleiter
DOI: 10.1080/14786437508229642
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摘要: Abstract Defocus imaging by transmission electron microscopy is applied for the first time to semi-crystalline polymers. The of amorphous and crystalline regions this technique due different inner potentials two regions. Evidence presented that permits direct observation in polymers without any special preparation procedure such as staining. In comparison with other known methods, main advantages new are better resolution wider applicability.