作者: Evan Lee Goldstein , Lih-Yuan Lin , Leda Maria Lunardi , None
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摘要: Integrated connection-verification system for use in a micro-electro-mechanical system (MEMS) crossconnect device. The system uses application of a dithering signal such as a sinusoidal bias to an electrode plate associated with a micro-mirror switching element to dither the micro-mirror. The optical signal from the dithering micro-mirror is fed through a beam splitter, a portion of the optical signal thus being directed to a photodetector. If intensity modulation in the optical signal corresponding to the frequency of the dithering signal is detected by the photodetector associated with the micro-mirror, the connection path between the desired input and output ports is verified.