作者: Christian J Long , Nathan D Orloff , Kevin A Twedt , Thomas Lam , Fernando Vargas-Lara
DOI:
关键词:
摘要: Figure S1| Summary of the image processing steps used to analyze the conducting atomic force microscopy (C-AFM) image of a cross section of the multiwall carbon nanotube (MWCNT) epoxy sample. After manually preprocessing the image to separate close domains, we set all nonzero pixels to one, binarizing the image. We then removed small black features, and filled enclosed domains. Next, we eroded and dilated the image with an octagonal filter, and despeckled the image to remove isolated black features. Finally, we labelled all the enclosed domains with a unique index. The resulting area and volume fractions of the MWCNT-rich domains were approximately 40%, while the fraction of nonzero pixels that were located in a labeled domain was approximately 85%.