Structured illumination with infrared imaging for measuring thermal conductivity

作者: Ashwath Bhat , Chris Dames

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摘要: With developments in advanced manufacturing and materials by design comes the need for high-throughput thermal characterization and inspection. Towards this end, Structured Illumination with Thermal Imaging (SITI) is an all-optical pump-probe thermal characterization technique recently developed by our group. In the first generation [Zheng et al., Appl. Phys. Rev. 9, 021411 (2022)] SITI uses an LED with a digital micromirror device (DMD) to" structurally illuminate" and heat the sample with dynamic patterns, a visible light camera for thermoreflectance based" thermal imaging"[leveraging a Microsanj MTIR120], and the resultant temperature response was fit with a thermal model to characterize the sample's thermal properties. This represents a novel approach to dynamic and flexible spatial mapping of thermal properties by virtue of being a non-contact technique and having a simpler scanning means (computer …

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