作者: Philip E Kaaret , J Schwartz , Paolo Soffitta , J Dwyer , Ping-Shine Shaw
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摘要: The Stellar X-ray Polarimeter (SXRP) will be the third orbiting stellar x-ray polarimeter, and should provide an order of magnitude increase in polarization sensitivity over its predecessors. The SXRP exploits the polarization dependence of reflection from a graphite Bragg crystal and scattering from a lithium Thomson scattering target to measure the linear polarization of x- rays from astrophysical sources. In this paper, we review the status of the SXRP instrument.