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摘要: In this talk a discussion of the opportunities offered by high brilliance 4 th generation sources for the investigation of the electronic properties of solids is presented. The flexibility in the design of modern insertion devices extends the available spectral range of intermediate energy machines from the very soft to the hard x-ray region (> 10 keV). In this wide spectral range, sources with average brilliances of the order 10 22 to 10 23 ph/s/mm 2/mrad 2/0.1% bw would allow a variety of novel experiments. The scope of valence-band photoemission, one of the most important electronic structure probes, could be extended by performing angle-resolved experiments with microfocus beams, thus exploring inhomogenities and phase-separation phenomena, which are of increasing importance in the physics of strongly correlated electron systems [1, 2, 3, 4]. In addition, use of hard x-ray photons for valence band photoemission …