Mapping the three-dimensional stress distribution of GaN-based light emitting diode with confocal Raman and photoluminescence spectromicroscope
作者： Hui-Yu Cheng , Wei‐Liang Chen , Yi-Hsin Huang , Tien‐Chang Lu , Yu‐Ming Chang
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摘要: Conclusion1. PL mapping of MQW layer shows that the MQW can be divided into v-pits, bright, and dark areas. The dark and bright areas form pattern that can be directly correlated to PSS structure. 2. E
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