Characterization of FD-SOI MOSFETs based on EKV model
Christian Renaux , Krzysztof Kucharski , Denis Flandre , Daniel Tomaszewski
MOS-AK Workshop 2005
2005
Characterization of test devices for development of nanowire sensor FETs
Michal Zaborowski , Daniel Tomaszewski , Piotr Grabiec , Andrzej Panas
international conference mixed design of integrated circuits and systems 407 -411
1
2012
Monolithic active pixel detector realized in silicon on insulator technology
Halina Niemiec , Krzysztof Kucharski , Miroslaw Grodner , Daniel Tomaszewski
Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment 535 ( 1) 398 -403
14
2004
Chromium nano-width ribbons by standard lithography and wet etching
Michal Zaborowski , Ivo W. Rangelow , Piotr Grabiec
Microelectronic Engineering 73 ( 1) 588 -593
2004
Micro and nano device — Customer-Oriented Product e-Engineering in e-CoFrame
Tomasz Bieniek , Grzegorz Janczyk , Pawel Janus , Jerzy Szynka
echallenges conference 1 -5
1
2010
An integrated system for Water Risk Management in EuRope - WARMER
Andrzej Filipkowski , Rosa Allabashi , Alastair Allen , Piotr Grabiec
Autmonet: 3rd International IWA Conference on Automation in Water Quality Monitoring
2
2007
Capacitively Coupled Active Pixel Sensors with Analog Readout for Future e + e - Colliders
Chiara Meroni , Jacek Marczewski , Piotr Grabiec , Massimo Caccia
Acta Physica Polonica B 30 ( 6) 2075
7
1999
Shear force microscopy using piezoresistive cantilevers in surface metrology
Teodor Gotszalk , Daniel Kopiec , Andrzej Sierakowski , Paweł Janus
Scanning Microscopies 2014 9236
2
2014
Design, technology, and application of integrated piezoresistive scanning thermal microscopy (SThM) microcantilever
Paweł Janus , Piotr Grabiec , Andrzej Sierakowski , Teodor Gotszalk
Scanning Microscopies 2014 9236
8
2014
Fabrication and metrology of electromagnetically actuated microcantilever arrays for biochemical sensing
Teodor Gotszalk , Konrad Nieradka , Daniel Kopiec , Grzegorz Maloziec
international conference on nanotechnology 1 -4
2012
Microcantilever array biosensors for detection and recognition of Gram-negative bacterial endotoxins
Konrad Nieradka , Katarzyna Kapczyńska , Jacek Rybka , Tomasz Lipiński
Sensors and Actuators B-chemical 198 114 -124
17
2014
Fabrication and characterization of junctionless MOSFETs for sensor applications
Michal Zaborowski , Daniel Tomaszewski , Jolanta Malesinska , Piotr Grabiec
2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES) 367 -371
1
2014
Microsystem technology as a road from macro to nanoworld.
Piotr Grabiec , Krzysztof Domański , Paweł Janus , Michał Zaborowski
Bioelectrochemistry 66 ( 1) 23 -28
5
2005
MEMS displacement generator for atomic force microscopy metrology
Michał Babij , Wojciech Majstrzyk , Andrzej Sierakowski , Paweł Janus
Measurement Science and Technology 32 ( 6) 065903
2021
Gated field emitter arrays
Tomasz Debski , Wolfgang Barth , Ivo W. Rangelow , Steffen Biehl
Microelectronic Engineering 57-58 813 -818
2
2001
Reliability issues of e-Cubes heterogeneous system integration
Grzegorz Janczyk , Tomasz Bieniek , Jerzy Szynka , Piotr Grabiec
Microelectronics Reliability 48 ( 8) 1133 -1138
3
2008
Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy.
Grzegorz Wielgoszewski , Piotr Pałetko , Daniel Tomaszewski , Michał Zaborowski
Micron 79 93 -100
5
2015
A high-resolution measurement system for novel scanning thermal microscopy resistive nanoprobes
Grzegorz Wielgoszewski , Przemysław Sulecki , Paweł Janus , Piotr Grabiec
Measurement Science and Technology 22 ( 9) 094023
24
2011
Piezoresistive sensors for scanning probe microscopy
Teodor Gotszalk , Piotr Grabiec , Ivo W. Rangelow
Ultramicroscopy 82 ( 1) 39 -48
132
2000
Quality factor and resonant frequency measurement by ARMA process identification of randomly excited MEMS/NEMS cantilever
Grzegorz Jozwiak , Daniel Kopiec , Wojciech Majstrzyk , Teodor Gotszalk
international conference on manipulation manufacturing and measurement on nanoscale 151 -154
2014