JohnP Hayes , Younggap You
Microelectronics Reliability 29 ( 2) 294
Alaghi , Hayes , Yu
international conference on computer aided design 195 -201
GEORGE F Viamontes , IGOR L Markov , JOHN P Hayes
Mar
HUSSAIN AL-ASAAD , JOHN P HAYES , TREVOR MUDGE
Proc. International Congress on Dynamics and Control Systems
GREGORY S AMACHER , JANET S MICHAELS , KAREN W WINGET , MELINDA MOEUR
Forest Science 48 1 -1
DAVID VAN CAMPENHOUT , TREVOR MUDGE , JOHN P HAYES
MA BREUER , AD FRIEDMAN , JP HAYES
JP HAYES , DE WILLIAMS , PR PAYNE
Archaeologica Cantiana Maidstone 98 177 -189
Anne Marie McLaughlin , N GIBBONS , M FITZGIBBON , JT POWER
American journal of respiratory and critical care medicine 186 ( 8) 807 -808
JP HAYES , JZ ILICH , LC HSIEH , V MATKOVIC
FASEB JOURNAL 8 ( 4) A166 -A166
Igor L Markov , John P Hayes , MICHIGAN UNIV ANN ARBOR DEPT OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCE
Srinivasan Murali , Giovanni De Micheli , Viacheslav Izosimov , Paul Pop
Krishnendu Chakrabarty , John P Hayes
Proceedings., International Test Conference 501 -510
Krishendu Chakrabarty , John P Hayes
Microelectronics Reliability 4 ( 36) 539 -539
Krishnendu Chakrabarty , John P Hayes
Proceedings: San Diego Convention Center, San Diego, Calif., June 6-10, 1994 1001 351 -351
Guangyu Chen , Guilin Chen , Mingsong Chen , Kameshwar Rao Chesetti
Nagarajan Kandasamy , Sherif Abdelwahed , Gregory C Sharp , John P Hayes
Springer Berlin Heidelberg 174 -188