引用次数
引用: 1,075
H-指数: 16
I10-指数 : 25
出版物: 90
SRAM lifetime improvement by using adaptive proactive reconfiguration
Amat , Pouyan , Rubio
international conference mixed design of integrated circuits and systems 115 -119
2012
Design and implementation of an adaptive proactive reconfiguration technique for SRAM caches
Peyman Pouyan , Esteve Amat , Francesc Moll , Antonio Rubio
design, automation, and test in europe 1303 -1306
1
2013
Reliability study on technology trends beyond 20nm
Esteve Amat , Antonio Calomarde , Antonio Rubio
international conference mixed design of integrated circuits and systems 414 -418
7
2013
Strain relevance on the improvement of the 3T1D cell performance
Carmen Garcia Almudever , Esteve Amat , Ramon Canal , Antonio Rubio
international conference mixed design of integrated circuits and systems 120 -123
2012
Variability Influence on FinFET-Based On-Chip Memory Data Paths.
Esteve Amat , Antonio Calomarde , Ramon Canal , Antonio Rubio
Journal of Low Power Electronics 11 250 -255
2015
Processing dependences of CHC degradation on strained-Si pMOSFETs
Esteve Amat , Xavier Aymerich , Rosana Rodriguez , Javier Martin Martinez
2010
Impact of bulk/SOI 10nm FinFETs on 3T1D-DRAM cell performance
Esteve Amat , Carmen G. Almudever , Nivard Aymerich , Ramon Canal
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology 1 -3
2
2012
Peculiar characteristics of nanocrystal memory cells programming window
Alberto Gasperin , Esteve Amat , Javier Martin , Marc Porti
Journal of Vacuum Science & Technology B 27 ( 1) 512 -516
2
2009
UTBB FDSOI suitability for IoT applications: Investigations at device, design and architectural levels
Florent Berthier , Edith Beigne , Frédéric Heitzmann , Olivier Debicki
Solid-state Electronics 125 14 -24
4
2016
Resistive Random Access Memory Variability and Its Mitigation Schemes
Peyman Pouyan , Esteve Amat , Said Hamdioui , Antonio Rubio
Journal of Low Power Electronics 13 ( 1) 124 -134
2
2017
Process variability-aware proactive reconfiguration technique for mitigating aging effects in nano scale SRAM lifetime
Peyman Pouyan , Esteve Amat , Antonio Rubio
vlsi test symposium 240 -245
17
2012
Monitoring SRAM BTI degradation by current-based tracking technique
Peyman Pouyan , Esteve Amat , Antonio Rubio
international new circuits and systems conference 1 -4
2
2016
RRAM variability and its mitigation schemes
Peyman Pouyan , Esteve Amat , Said Hamdioui , Antonio Rubio
power and timing modeling optimization and simulation 141 -146
7
2016
Reliability challenges in design of memristive memories
Peyman Pouyan , Esteve Amat , Antonio Rubio
2014 5th European Workshop on CMOS Variability (VARI) 1 -6
28
2014
Statistical lifetime analysis of memristive crossbar matrix
Peyman Pouyan , Esteve Amat , Antonio Rubio
international conference on design and technology of integrated systems in nanoscale era 1 -6
8
2015
Exploring Strategies to Contact 3D Nano-Pillars.
Esteve Amat , Alberto del Moral , Marta Fernández-Regúlez , Laura Evangelio
Nanomaterials 10 ( 4) 716
1
2020
Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs
V. Ramgopal Rao , Paolo Magnone , Gino Giusi , Calogero Pace
IEEE Transactions on Electron Devices 56 ( 5) 1063 -1069
21
2009
Channel-Hot-Carrier Degradation and Bias Temperature Instabilities in CMOS Inverters
Javier Martin-Martinez , Simone Gerardin , Esteve Amat , Rosana Rodriguez
IEEE Transactions on Electron Devices 56 ( 9) 2155 -2159
14
2009
Effects of the Localization of the Charge in Nanocrystal Memory Cells
Alberto Gasperin , Esteve Amat , Marc Porti , Javier MartÍn-MartÍnez
IEEE Transactions on Electron Devices 56 ( 10) 2319 -2326
3
2009
Memristive crossbar design and test in non-adaptive proactive reconfiguring scheme
Peyman Pouyan , Esteve Amat , Antonio Rubio
2015 European Conference on Circuit Theory and Design (ECCTD) 1 -4
2015