Douglas T Smith
机构: National Institute of Standards and Technology
每年引用次数
引用次数
引用: 4,053
H-指数: 28
I10-指数 : 42
出版物: 98
Review of SI traceable force metrology for instrumented indentation and atomic force microscopy
Jon R Pratt , John A Kramar , David B Newell , Douglas T Smith
Measurement Science and Technology 16 ( 11) 2129 -2137
151
2005
Effects of different whiskers on the reinforcement of dental resin composites
Hockin H.K Xu , Janet B Quinn , Douglas T Smith , Anthony A Giuseppetti
Dental Materials 19 ( 5) 359 -367
167
2003
National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report
Michael T Postek , Richard R Cavanagh , C M Allocca , Douglas T Smith
Michael T. Postek, Richard R. Cavanagh, C M. Allocca, Douglas T. Smith, Robert D. Shull, David A. Wollman, David G. Seiler, Stephen Knight, A Diebold, Richard M. Silver, Charles W. Clark, Kevin W. Lyons, James R. Whetstone, Ronald F. Boisvert
2006
Progress toward Systeme International d'Unites traceable force metrology for nanomechanics
Jon R Pratt , Douglas T Smith , David B Newell , John A Kramar
Journal of materials research 19 ( 1) 366 -379
105
2004
SI traceability of force at the nanonewton level
David B Newell , Jon R Pratt , John A Kramar , Douglas T Smith
Proceedings of National Conference of Standards Laboratories International 14 1279 -1288
7
2001
Towards a traceable nanoscale force standard
Jon R Pratt , David B Newell , Edwin R Williams , Douglas T Smith
Jon R. Pratt, David B. Newell, Edwin R. Williams, Douglas T. Smith, John A. Kramar
7
2001
Microforce and instrumented indentation research at the national institute of standards and technology, Gaithersburg, MD
Jon R Pratt , David B Newell , John A Kramar , Douglas T Smith
Jon R. Pratt, David B. Newell, John A. Kramar, Douglas T. Smith
2
2003
Method of adhering substrates
Douglas T Smith , Alexis Grabbe , Roger G Horn
17
1994
Compact force sensors for low-force mechanical probe calibration
Douglas T Smith , Shane Woody , Jon R Pratt
VDI BERICHTE 1685 309 -316
8
2002
Development of a miniature, multichannel, extended, range Fabry-Perot Fiber-Optic Laser Interferometer system for low frequency Si-traceable displacement measurement
Bartosz K Nowakowski , Douglas T Smith , Stuart T Smith
Downloaded on 11
3
2015
Measurement of the gold–gold bond rupture force at 4 K in a single-atom chain using photon-momentum-based force calibration
Douglas T Smith , Jon R Pratt
Measurement Science and Technology 26 ( 2) 025202 -025202
3
2014
Methods for transferring the SI unit of force from millinewtons to piconewtons
Gordon A Shaw , Koo-Hyun Chung , Douglas T Smith , Jon R Pratt
Proceedings of the SEM Annual Conference, Albuquerque New Mexico USA 1 -4
2
2009
ADVANCEMENTS IN DEVELOPMENT OF AN ULTRA-PRECISION, SI-TRACEABLE NANOINDENTATION PLATFORM
Bartosz K Nowakowski , Stuart T Smith , Douglas T Smith
Proc. ASPE
1
2010
Accurate Picometers for DC and Low-Frequency Displacement Measurement
Jon R Pratt , Douglas T Smith , LP Howard
ASPE Spring Topical Meeting on Mechanical Metrology and Measurement Uncertainty 3 -6
1
2009
Traceable micro-force calibration for instrumented indentation testing
Douglas T Smith , Gordon A Shaw , Richard Seugling , Jon R Pratt
Douglas T. Smith, Gordon A. Shaw, Richard Seugling, Jon R. Pratt, Dan Xiang
1
2007
Conference Proceedings: International Workshop on Instrumented Indentation
Douglas T Smith
NIST Special Publication 896 ( 19980017728)
1
1996
Characterization of a SI-Traceable Vacuum-Compatible Precision Nanoindentation Platform
Bartosz K Nowakowski , Douglas T Smith , Stuart Smith
Bartosz K. Nowakowski, Douglas T. Smith, Stuart Smith
2012
Use of Instrumented Indentation to Determine Mechanical Properties of Thin Films, Coatings and Functionally Graded Materials
Douglas T Smith
Douglas T. Smith 135 -140
2000
DEVELOPMENT OF A METROLOGICAL NANOINDENTER
Bartosz K Nowakowski , Stuart T Smith , Douglas T Smith , Dylan J Morris
Conference Proceedings:.
Douglas T Smith , T Campbell , R Allard , J Dykes
US Department of Commerce, National Institute of Standards and Technology
1
1996