Review of SI traceable force metrology for instrumented indentation and atomic force microscopy
作者： Jon R Pratt , John A Kramar , David B Newell , Douglas T Smith
DOI: 10.1088/0957-0233/16/11/002
关键词: Atomic force microscopy 、 NIST 、 Nanotechnology 、 Materials science 、 Units of measurement 、 Metrology 、 Nanoscopic scale 、 Instrumented indentation 、 Instrumentation (computer programming) 、 Applied mathematics
摘要: … in terms of SI mechanical quantities, the availability of quantum-based electrical standards has … The capacitance of this transducer is a function of mechanical force; we use an Andeen–…
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