John Michael Walls
机构: Loughborough University
每年引用次数
引用次数
引用: 5,479
H-指数: 35
I10-指数 : 125
出版物: 302
3-DIMENSIONAL SECONDARY ION MASS-SPECTROMETRY IMAGING AND RETROSPECTIVE DEPTH PROFILING
DR Kingham , AR Bayly , DJ Fathers , P Vohralik
Scanning Microscopy 1 ( 2) 463 -469
11
1987
AB Christie in Surface Analysis and Pretreatments of Plastics and Metals. ed. by D. M. Brewis
JM Walls
Applied Science Publishers 13 -13
6
1982
An introduction to in-line holography and its applications
P Dunn , JM Walls
Symposium on Controlled Droplet Application 23 -34
6
1978
Droplet size distribution from an agricultural spray using in-line holography
P Dunn , JM Walls
the proceedings of a conference at the University of Saltford
6
1977
Chapter 2
JM Walls , AB Christie
Surface Analysis and Pretreatment of Plastics and Metals 13 -13
4
1982
Field-ion microscopy and related techniques: a bibliography, 1951-1978
RE Thurstans , JM Walls
(No Title)
4
1980
The Origins of Void formation in Sputtered CdSe
Rachael Greenhalgh , Pete Hatton , Vlad Kornienko , Ali Abbas
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC) 0886 -0889
2
2021
A lloys
AB Christie , I Sutherland , JM Walls
Surface Science 135 601 -610
1
1983
FACTORS AFFECTING THE INTEGRITY OF SPUTTER-DEPTH PROFILES IN SURFACE ANALYSIS
JM Walls , DE Sykes , DD Hall
Proceedings of the Eighth International Vacuum Congress..., Sept. 22-26, 1980, Cannes, France: Thin films 1 287 -287
1
1980
Effect of Dilute Acid Exposure on Sol-gel Porous Silica Anti-Reflection Coatings
Farwah Bukhari , Luke Jones , Adam Law , Ali Abbas
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC) 0705 -0707
2022
The moire pattern produced by overlapping zone plates
I Leifer , JM Walls , HN Southworth
SPIE MILESTONE SERIES MS 128 227 -241
1996
Three Dimensional Secondary Ion Mass Spectrometry Imaging and Retrospective Depth Profiling
DR Kingham , AR Bayly , DJ Fathers , P Vohralik
Scanning Microscopy 1 ( 2) 4 -4
1987
Devices for measuring & controlling temperatures above 1500 c Temperature analysis from multispectral infrared data MH Horman (6710-48 Ave SW, Seattle WA 98136) Appl Optics 15 (9) 2099-104 (1976) Automatic ladling in non-ferrous foundries Anon Metals & Materials (4) 16-17 (1976)
J Anon , BJ Jody , SC Saxena , JM Pelmore
Bibliography on the High Temperature Chemistry and Physics of Materials 20 5 -5
1976
Field-Ion Microscope Observations of Sputtered W Surfaces
JM Walls , E Braun , HN Southworth
Proceedings of the Sixth International Vacuum Congress, International Union for Vacuum Science, Technique and Applications, Tokyo. 1974, 355-358
1974
Internal Stress Analysis in Thin Film CdTe Deposited by Magnetron Sputtering
PM Kaminski , C Chen , A Abbas , JM Walls
EDITORL4L BOARD
DF Fedoseev , DR Flinn , TC Franklin , H Herman
Cadmium chloride assisted re-crystallization of CdTe: The effect of annealing over-treatment
A. Abbas , G.D West , J.W. Bowers , P. M. Kaminski
photovoltaic specialists conference 0701 -0706
12
2014
Effect of varying process parameters on CdTe thin film device performance and its relationship to film microstructure
Amit Munshi , Ali Abbas , John Raguse , Kurt Barth
photovoltaic specialists conference 1643 -1648
11
2014
Oxygenated CdS window layers for thin film CdTe photovoltaics by pulsed DC magnetron sputtering
P.M. Kaminski , F. Lisco , A. Abbas , J. W. Bowers
photovoltaic specialists conference 1626 -1631
4
2014
Broadband anti-reflection coatings for thin film photovoltaics
P.M. Kaminski , G. Womack , J.M. Walls
photovoltaic specialists conference 2778 -2783
10
2014