Optically balanced, multi-pass displacement interferometry for picometer stability testing
Jo W. Spronck , Robert H.Munnig Schmidt , Justine H. Hatzigeorgopoulos , Jonathan D. Ellis
22nd Annual Meeting of the American Society for Precision Engineering, ASPE 2007, 14 October 2007 through 19 October 2007, Dallas, TX, 1-4
1
2007
First demonstration of human visual performance through refractive-index modified ophthalmic devices written in hydrogels
Gustavo Gandara-Montano , Len Zheleznyak , Len Zheleznyak , Geunyoung Yoon
Investigative Ophthalmology & Visual Science 58 ( 8) 1274 -1274
3
2017
An instrument for nanoindentation without frame stiffness dependecy
Robert J. Hocken , Jonathan D. Ellis , Stuart T. Smith
21st Annual Meeting of the American Society for Precision Engineering, ASPE 2006
2006
Magnetic field effects on the secondary beat frequency profile for three mode HeNe laser stabilization
Jo W. Spronck , Eric S. Buice , Robert H.Munnig Schmidt , Jonathan D. Ellis
24th Annual Meeting of the American Society for Precision Engineering, ASPE 2009
2009
High powered frequency stabilized hene gas laser with 3.5 MW from a single mode
Dirk Voigt , Jo W. Spronck , Robert H.Munnig Schmidt , Jonathan D. Ellis
26th Annual Meeting of the American Society for Precision Engineering, ASPE 2011 220 -223
2011
Overview and comparison of spatial light modulator calibration methods
Maxim Shusteff , Maxim Shusteff , Robert M. Panas , Christopher M. Spadaccini
31st Annual Meeting of the American Society for Precision Engineering, ASPE 2016 293 -299
2016
Errors in measurement and compensation algorithms for periodic nonlinearity correction
Jo W. Spronck , Robert H.Munnig Schmidt , Jonathan D. Ellis , Michiel Baas
25th Annual Meeting of the American Society for Precision Engineering, ASPE 2010 144 -147
1
2010
Absolute thickness metrology with high precision using low coherence interferometry
Duncan T. Moore , Jonathan D. Ellis , Yang Zhao , Greg Schmidt
29th Annual Meeting of the American Society for Precision Engineering, ASPE 2014 417 -421
2014
Retrace error calibration algorithm for non-null interferometric testing
Thomas G. Brown , Jonathan D. Ellis , Martin Tangari Larrategui , Martin Tangari Larrategui
34th Annual Meeting of the American Society for Precision Engineering, ASPE 2019 157 -161
2019
Straightness measurement based on knife-edge sensing
Steven R. Gillmer , Steven R. Gillmer , Xiangzhi Yu , Jonathan D. Ellis
31st Annual Meeting of the American Society for Precision Engineering, ASPE 2016 372 -376
1
2016
AOPC 2015: Optical Test, Measurement, and Equipment
Yongcai Guo , Junpeng Guo , Sen Han , Jonathan D. Ellis
AOPC 2015: Optical Test, Measurement, and Equipment 9677
2015
Systems-level integration for focused beam scatterometry
Steven R. Gillmer , Stephen T. Head , Thomas G. Brown , Jonathan D. Ellis
30th Annual Meeting of the American Society for Precision Engineering, ASPE 2015 120 -125
2015
Beam aberration analysis of differential wavefront interferometry
Steven R. Gillmer , Xiangzhi Yu , Jonathan D. Ellis , Chen Wang
29th Annual Meeting of the American Society for Precision Engineering, ASPE 2014 412 -416
2014
Large stroke scanning system for femtosecond micromaching of custom optical structures in opthalmic materials
Wayne H. Knox , Jonathan D. Ellis , Daniel E. Savage , Daniel R. Brooks
29th Annual Meeting of the American Society for Precision Engineering, ASPE 2014 280 -284
2014
Experimentally investigate the alignment and beam aberration effects on interferometric differential wavefront sensing
Xiangzhi Yu , Jonathan D. Ellis
5th ASPE Topical Meeting on Precision Interferometric Metrology 93 -96
2015
Fiber-coupled 3-DOF interferometer for euv lithography stage metrology
Steven Gillmer , Joshua Tarbutton , Shane C. Woody , Jonathan D. Ellis
ASPE 2012 Summer Topical Meeting on Precision Engineering and Mechatronics Suporting the Semiconductor Industry 36 -41
2
2012
Three degree-of-freedom optical probe with fiber detection using carrier fringe methods
Michael A. Echter , Christopher D. Roll , Christopher D. Roll , Andrew D. Keene
28th Annual Meeting of the American Society for Precision Engineering, ASPE 2013 378 -384
1
2013
Methods for performance evaluation of single axis positioning systems: Move and settle performance
Jonathan D Ellis , Stephen Ludwick ,
28th Annual Meeting of the American Society for Precision Engineering, ASPE 2013 493 -497
2
2013
Absolute refractive index sensing and tracking based on variable length vacuum cell
Xiangzhi Yu , Jonathan D. Ellis , Tieli Zhang
5th ASPE Topical Meeting on Precision Interferometric Metrology 87 -90
2015
Periodic error compensation using the continuous wavelet transform
Tony L. Schmitz , Joshua A. Tarbutton , Jonathan D. Ellis , John R. Troutman
29th Annual Meeting of the American Society for Precision Engineering, ASPE 2014 408 -411
1
2014