Impact parameters for ionization by high-energy electrons

M.P Oxley , L.J Allen
Ultramicroscopy 80 ( 2) 125 -131

13
1999
Correction terms and approximations for atom location by channelling enhanced microanalysis

M.P Oxley , L.J Allen , C.J Rossouw
Ultramicroscopy 80 ( 2) 109 -124

16
1999
Exit wave reconstruction using soft X-rays

L.J Allen , W McBride , M.P Oxley
Optics Communications 233 ( 1) 77 -82

16
2004
Local observation of the site occupancy of Mn in a MnFePSi compound.

M. J. Neish , M. P. Oxley , J. Guo , B. C. Sales
Physical Review Letters 114 ( 10) 106101

18
2015
Investigation of the effects of partial coherence on exit wave reconstruction

L. J. ALLEN , W. MCBRIDE , N. L. O'LEARY , M. P. OXLEY
Journal of Microscopy 216 ( 1) 70 -75

12
2004
Investigating phase transitions from local crystallographic analysis based on statistical learning of atomic environments in 2D MoS2-ReS2

Eugene A. Eliseev , Anna N. Morozovska , Pulickel Ajayan , Lukas Vlcek
Applied physics reviews 8 ( 1) 011409

2021
Probing atomic-scale symmetry breaking by rotationally invariant machine learning of multidimensional electron scattering

Sergei V. Kalinin , Rama Vasudevan , Mark P. Oxley , Ondrej Dyck
npj Computational Materials 7 ( 1) 1 -6

2021
2019
Distinguishability of Structures via Principal Component Analysis: Application to 4D STEM

Mark P. Oxley , Sergei V. Kalinin , Rama K. Vasudevan
Microscopy and Microanalysis 25 126 -127

2019
Following the Electrons: Simulation for High-Resolution STEM and CBED

Mark P. Oxley
Microscopy and Microanalysis 25 2680 -2681

2019
Insulating Ferromagnetic LaCoO 3 − δ Films: A Phase Induced by Ordering of Oxygen Vacancies

Neven Biškup , Juan Salafranca , Virat Mehta , Mark P. Oxley
Physical Review Letters 112 ( 8) 087202

156
2014
Atomic-Resolution Imaging of Spin-State Superlattices in Nanopockets within Cobaltite Thin Films

Jaume Gazquez , Weidong Luo , Mark P. Oxley , Micah Prange
Nano Letters 11 ( 3) 973 -976

78
2011
Limitations to the measurement of oxygen concentrations by HRTEM imposed by surface roughness.

Andrew R. Lupini , Matthew F. Chisholm , Klaus van Benthem , Leslie J. Allen
Microscopy and Microanalysis 11 ( 2) 111 -113

3
2005
Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy

Klaus van Benthem , Andrew R. Lupini , Mark P. Oxley , Scott D. Findlay
Ultramicroscopy 106 ( 11) 1062 -1068

101
2006
Single Atom Imaging and Spectroscopy of Impurities in 2D Materials

Wu Zhou , Andrew R. Lupini , Junhao Lin , Yongji Gong
Microscopy and Microanalysis 22 862 -863

2016
Low-Loss Imaging of Defect Structures in Two Dimensional Materials Using Aberration Corrected Scanning Transmission Electron Microscopy

Mark P. Oxley , Myron D. Kapetanakis , Wu Zhou , Juan-Carlos Idrobo
Microscopy and Microanalysis 22 1410 -1411

2016
Identifying Novel Polar Distortion Modes in Engineered Magnetic Oxide Superlattices

Saurabh Ghosh , Amber Choquette , Steve May , Mark P. Oxley
Microscopy and Microanalysis 23 1590 -1591

2017
Accurate Calculation of CBED Patterns for 4D STEM Using Electron Densities Calculated by Density Functional Theory.

Mark P. Oxley , Axiel Yael Birenbaum , Tribhuwan Pandey , Valentino R. Cooper
Microscopy and Microanalysis 24 116 -117

2
2018
Quantification of Low Voltage Images of 2-dimensional Materials in Aberration Corrected Scanning Transmission Electron Microscopy.

Mark P. Oxley , Nicholas G. Cross , Gerd Duscher , Leslie J. Allen
Microscopy and Microanalysis 23 464 -465

2017