Following the Electrons: Simulation for High-Resolution STEM and CBED

作者: Mark P. Oxley

DOI: 10.1017/S1431927619014132

关键词: High resolutionElectronComputational physicsMaterials science

摘要:

参考文章(3)
B. D. Forbes, A. V. Martin, S. D. Findlay, A. J. D’Alfonso, L. J. Allen, Quantum mechanical model for phonon excitation in electron diffraction and imaging using a Born-Oppenheimer approximation Physical Review B. ,vol. 82, pp. 104103- ,(2010) , 10.1103/PHYSREVB.82.104103
L.J. Allen, A.J. D׳Alfonso, S.D. Findlay, Modelling the inelastic scattering of fast electrons. Ultramicroscopy. ,vol. 151, pp. 11- 22 ,(2015) , 10.1016/J.ULTRAMIC.2014.10.011
R. F. Loane, P. Xu, J. Silcox, Thermal vibrations in convergent‐beam electron diffraction Acta Crystallographica Section A. ,vol. 47, pp. 267- 278 ,(1991) , 10.1107/S0108767391000375