Total reflection X-ray spectrometry: method and applications
作者： Andreas Prange
DOI: 10.1016/0584-8547(89)80049-7
关键词: Orders of magnitude (temperature) 、 Total internal reflection 、 Ultra trace 、 Simple sample 、 Analytical chemistry 、 Mass spectrometry 、 Calibration curve 、 X-ray 、 Chemistry
摘要: … A schematic view of the total reflection X-ray optics is shown in Fig. 1. … the critical angle of total reflection for X-rays on quartz is reflected onto the … The low energy part of the exciting X-ray …
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