The enhancement mechanism of dielectric properties of Pb(Zr,Ti)O3 via (Mg2+,Sb3+) incorporation for supercapacitors

作者: F. Craciun , E. Dimitriu , B.S. Vasile , C.C. Negrila , R. Trusca

DOI: 10.1016/J.MTCHEM.2020.100350

关键词: High-resolution transmission electron microscopyFerroelectricityDopantDielectricCrystallographyX-ray photoelectron spectroscopyDielectric spectroscopyPerovskite (structure)Materials scienceSpectroscopy

摘要: Abstract Due to the extraordinary versatility of perovskite structure in accommodating different dopant ions its structure, recent years a huge number multifunctional materials have been developed. In this work we aim obtain high temperature-stable and dielectric constant for supercapacitors by doping divalent Mg2+ trivalent Sb3+ into octahedral sites, Sr2+ dodecahedral sites lead zirconate-titanate perovskite. The resulting (Pb0.95Sr0.05)(Zr0.425Ti0.45Mg0.042Sb0.083)O3-δ is examined X-ray diffraction, energy-dispersive spectroscopy, photoelectron spectroscopy (XPS), resolution transmission electron microscopy (HRTEM), (DS) resonance (RDS) order correlate composition, local ion valence chemical environment doped material with properties. HRTEM evidences that composite co-existent ferroelectric domains relaxor nanodomains, formed doping. XPS shows substitute Ti4+/Zr4+ ions, pointing these strong defects as main cause appearance phase. DS RDS found transforms re-entrant relaxor-ferroelectric about 104 which remains stable (within ±10%) temperature range up 250 °C, mechanism phase re-entrance below normal transition, being responsible enhancement.

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