Electro-thermal behaviour of a SiC JFET stressed by lightning-induced overvoltages
作者： Herve Morel , Dominique Bergogne , Youness Amieh , Abderahime Zaoui , Bruno Allard
DOI:
关键词: Electrical engineering 、 Lightning 、 Nuclear engineering 、 JFET 、 Surge 、 Inverter 、 Silicon carbide 、 Stress (mechanics) 、 Thermal 、 Generator (circuit theory) 、 Materials science
摘要: JFET are experimentally stressed to provide data for modelling, inverter and driver design. The experimental set-up is described. A surge generator built a SiC stressed. During the stress, temperature estimation done at increasing time steps, in order obtain full thermal response versus time.
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