Temperature Measurement of Power Semiconductor Devices by Thermo-Sensitive Electrical Parameters—A Review
作者： Yvan Avenas , Laurent Dupont , Zoubir Khatir
DOI: 10.1109/TPEL.2011.2178433
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摘要: This paper proposes a synthesis of different electrical methods used to estimate the temperature of power semiconductor devices. The following measurement methods are introduced: the voltage under low current levels, the threshold voltage, the voltage under high current levels, the gate-emitter voltage, the saturation current, and the switching times. All these methods are then compared in terms of sensitivity, linearity, accuracy, genericity, calibration needs, and possibility of characterizing the thermal impedance or the …
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hal.science 参考文章(61)
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