Structural analysis of strained LaVO 3 thin films

摘要: While structure refinement is routinely achieved for simple bulk materials, the accurate structural determination still poses challenges thin films due on one hand to small amount of material deposited thicker substrate and, other hand, intricate epitaxial relationships that substantially complicate standard x-ray diffraction analysis. Using both electron and diffraction, we analyze crystal LaVO3 grown (1 0 0)-oriented SrTiO3. Transmission microscopy study reveals are epitaxially SrTiO3 points presence 90° oriented domains. The mapping reciprocal space obtained by high resolution permits lattice parameters. We finally deduce strain accommodation imposes a monoclinic onto film. maps numerically processed extracted data computed refine atomic positions, which compared those using precession tomography.