Enhancement of high dielectric constant in CaCu$_3$Ti$_4$O$_1$$_2$/RuO$_2$ composites in the vicinity of the percolation threshold
作者： Rupam Mukherjee , Gavin Lawes , Boris Nadgorny
DOI: 10.1063/1.4893009
关键词: Materials science 、 Copper oxide 、 High-κ dielectric 、 Scanning electron microscope 、 Percolation threshold 、 Spectroscopy 、 Microstructure 、 Grain boundary 、 Dielectric 、 Composite material
摘要: We observe the large enhancement in dielectric response near percolation threshold a composite nanoparticle system consisting of metallic RuO$_2$ grains embedded into CaCu$_3$Ti$_4$O$_1$$_2$ (CCTO) matrix and annealed at 1100OC. To understand nature response, we compare CCTO fabricated by two different techniques, solid state process (CCTO$_S$$_S$) sol-gel (CCTO$_S$$_G$) with intrinsic constant both cases found to be on order 10$^3$-10$^4$ 10 kHz. For RuO$_2$/CCTO$_S$$_S$ RuO$_2$/CCTO$_S$$_G$ composites composites, an increase factors 7 5 respectively is observed vicinity about 0.1, moderate losses room temperature. Scanning electron microscopy Energy Dispersive X-ray spectroscopy indicate that difference size effect may arise from microstructure copper oxide enriched grain boundaries host CCTO.
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