Spectral Depth Profiling of Arbitrary Surfaces by Thermal Emission Decay—Fourier Transform Infrared Spectroscopy

摘要: We report a new spectroscopic technique that combines step-scanning Fourier transform infrared spectroscopy with opto-thermal transient emission radiometry (OTTER) in order to provide nearsurface depth-resolved spectra the range 700-1800 cm-1. It works nondestructively, without contact, samples of arbitrary shape and size, requiring prior preparation. The depth surface probed depends on thermal diffusivity sample; for organic materials it is ~10 μm. With homogeneous samples, absolute absorption coefficients can be measured. two-layered proved able distinguish between spectral properties top layer substrate estimate thickness layer. present theoretical analysis main design features instrumentation software, together studies layered validate methods illustrate potential practical applications.