作者: Zhiyu Liao , Faris Sinjab , Graham Gibson , Miles Padgett , Ioan Notingher
DOI: 10.1364/OE.24.012701
关键词: Optoelectronics 、 Optics 、 Spatially offset Raman spectroscopy 、 Raman scattering 、 Software 、 Attenuated total reflection 、 Optical path 、 Materials science 、 Infrared spectroscopy 、 Raman spectroscopy 、 Offset (computer science)
摘要: Spectral depth-profiling of optically turbid samples is high interest to a broad range applications. We present method for measuring spatially-offset Raman spectroscopy (SORS) over length scales by incorporating digital micro-mirror device (DMD) into sample-conjugate plane in the detection optical path. The DMD can be arbitrarily programmed collect/reject light at spatial positions 2D plane, allowing spatially offset measurements. demonstrate several geometries, including annular and simultaneous multi-offset modalities, both macro- micro-SORS measurements, all on same instrument. Compared other SORS DMD-based provides more flexibility with only minimal additional experimental complexity subsurface collection.