作者: Xin Yan , Yansheng Wang , Jianchi ZhOU , Tun Li , Jun Fan
DOI: 10.1109/EMCSI.2018.8495397
关键词: Busbar 、 Electronic engineering 、 Scattering parameters 、 Device under test 、 Computer science 、 Electromagnetic compatibility 、 Paper based 、 Pogo pin 、 Design for testing
摘要: A landing probe design is proposed in this paper based on pogo-pins. Landing probes are usually used to obtain TDR and S-parameters of the device under test (DUT) so that performance DUT can be evaluated. This has two major advantages. First, it durable. Second, easily integrated into automated testing systems. The designed works well up 20 GHz, which validated by measurement.