作者: A.A. Bright , P. Geldermans , T.R. Gheewala , K.R. Grebe , H.C. Jones
关键词: Critical path method 、 Jump 、 Magnetic flux 、 Engineering 、 Path (graph theory) 、 Power (physics) 、 Instruction cycle 、 Sequence 、 Electronic circuit 、 Electrical engineering
摘要: This letter describes the first system level test vehicle in Josephson technology. The experiment consists of four circuit chips assembled on two cards a high density, 3-dimensional, card-on-board package. A data path, which is representative critical path future prototype processor, was successfully operated with minimum cycle time 3.7ns. simulates jump control sequence and cache access each machine cycle. incorporates essential components logic, power package portions technology prototype.