Optical‐beam‐deflection atomic force microscopy: The NaCl (001) surface
作者： Gerhard Meyer , Nabil M. Amer
DOI: 10.1063/1.102985
关键词: Surface reconstruction 、 Optical microscope 、 Kelvin probe force microscope 、 Diffusion 、 Conductive atomic force microscopy 、 Optics 、 Scattering 、 Microscope 、 Chemistry 、 Noise (electronics) 、 Molecular physics
摘要: We have imaged, in ultrahigh vacuum, the (001) surface of NaCl using an optical‐beam‐deflectin force microscope operating short‐range repulsive regime. The design and performance characteristics are given, observed atomic corrugations compared with those deduced from He‐atom scattering experiments.
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