Reversible phase change in BixSe100−x chalcogenide thin films for using as optical recording medium
作者： M.M. Hafiz , O. El-Shazly , N. Kinawy
DOI: 10.1016/S0169-4332(00)00709-1
关键词: Selected area diffraction 、 Absorption (electromagnetic radiation) 、 Electron diffraction 、 Thin film 、 Microstructure 、 Amorphous solid 、 Optics 、 Transmission electron microscopy 、 Crystallization 、 Materials science 、 Analytical chemistry
摘要: … Selected area electron diffraction was used to characterize different phases observed during the crystallization process where the crystalline Bi 2 Se 3 phase was separated. Optical …
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