作者: Jiang Guojian , Zhuang Hanrui , Zhang Jiong , Ruan Meiling , Li Wenlan
关键词: Optical microscope 、 Dendrite (crystal) 、 Whiskers 、 Crystallography 、 Nitride 、 Microstructure 、 Vapor–liquid–solid method 、 Stacking fault 、 Crystal growth 、 Materials science 、 Composite material
摘要: The high resolution electron microscopy was used to investigate the microstructure of AlN whiskers. growth mechanisms whiskers were VLS and VS mechanism. phenomenon stacking fault analyzed. Moreover, mechanism dendritic crystal proposed.