Modeling the diffusion of solid copper into liquid solder alloys

作者: M.J. Rizvi , H. Lu , C. Bailey

DOI: 10.1016/J.TSF.2008.09.105

关键词: Scanning electron microscopeDiffusion processCopperMaterials scienceSolderingSoldering processDiffusion (business)MetallurgyMaterials ChemistryElectronic, Optical and Magnetic MaterialsSurfaces, Coatings and FilmsSurfaces and InterfacesMetals and Alloys

摘要: … The modeling results reveal that the diffusion coefficient is one of the major factors that govern the rate at which solid Cu dissolve in the molten solder. The predicted dissolved amounts …

参考文章(9)
Giles Humpston, David M. Jacobson, Principles of Soldering and Brazing ,(1992)
M.J. Rizvi, C. Bailey, Y.C. Chan, M.N. Islam, H. Lu, Effect of adding 0.3 wt% Ni into the Sn–0.7 wt% Cu solder: Part II. Growth of intermetallic layer with Cu during wetting and aging Journal of Alloys and Compounds. ,vol. 438, pp. 122- 128 ,(2007) , 10.1016/J.JALLCOM.2006.08.071
V.I. Dybkov, O.V. Duchenko, Growth kinetics of compound layers at the nickel-bismuth interface Journal of Alloys and Compounds. ,vol. 234, pp. 295- 300 ,(1996) , 10.1016/0925-8388(95)02096-9
D. Ma, W. D. Wang, S. K. Lahiri, Scallop formation and dissolution of Cu–Sn intermetallic compound during solder reflow Journal of Applied Physics. ,vol. 91, pp. 3312- 3317 ,(2002) , 10.1063/1.1445283
M. J. Rizvi, Y. C. Chan, C. Bailey, H. Lu, M. N. Islam, B. Y. Wu, Wetting and Reaction of Sn-2.8Ag-0.5Cu-1.0Bi Solder with Cu and Ni Substrates Journal of Electronic Materials. ,vol. 34, pp. 1115- 1122 ,(2005) , 10.1007/S11664-005-0239-6
Paul G. Shewmon, Diffusion in solids ,(1963)
H. K. Kim, K. N. Tu, Rate of consumption of Cu in soldering accompanied by ripening Applied Physics Letters. ,vol. 67, pp. 2002- 2004 ,(1995) , 10.1063/1.114767
Ahmed Sharif, Y.C Chan, Dissolution kinetics of BGA Sn–Pb and Sn–Ag solders with Cu substrates during reflow Materials Science and Engineering B-advanced Functional Solid-state Materials. ,vol. 106, pp. 126- 131 ,(2004) , 10.1016/J.MSEB.2003.09.004