作者: N. Wang , H. B. Lu , W. Z. Chen , T. Zhao , F. Chen
DOI: 10.1063/1.125297
关键词: High-resolution transmission electron microscopy 、 Superlattice 、 Crystallography 、 Epitaxy 、 Pulsed laser deposition 、 Optoelectronics 、 Transmission electron microscopy 、 Materials science 、 Molecular beam epitaxy 、 Electron diffraction 、 Thin film
摘要: The morphology and microstructure of BaTiO3/SrTiO3 (BTO/STO) superlattices grown epitaxially on STO (001) substrates by a computer-controlled laser molecular-beam epitaxy deposition system have been characterized means atomic force microscopy high-resolution transmission electron (HRTEM). It is found that the HRTEM images taken along [120] direction BTO show maximal contrast difference. is, therefore, observed consist highly oriented single-crystalline multilayered structure. As identified HRTEM, number unit cells in each or layer matches very well with obtained from reflection high-energy diffraction oscillations. surfaces interfaces are atomically smooth. In superlattices, ratio between c axis about 4% larger than measured bulk crystals.