作者: S. B. Antonelli , T. L. Allen , D. C. Johnson , V. M. Dubin
DOI: 10.1149/1.2193332
关键词: Materials science 、 Phase (matter) 、 Differential scanning calorimetry 、 Thermal stability 、 Crystallography 、 Crystallization 、 Amorphous solid 、 Chemical engineering 、 Diffraction 、 Tungsten 、 Nucleation
摘要: Electroless Ni-W-P films are compared to Ni-P with the same P/Ni ratio in order study role of tungsten stabilizing amorphous state. Differential scanning calorimetry and high-angle X-ray diffraction used these compare their thermal stability crystallization behavior. The results indicate that W inhibits nucleation Ni 3 P phase films, but has limited ability suppress face-centered cubic because is soluble Ni.