作者: W. J. Moore
DOI: 10.1364/AO.33.004164
关键词: Refractive index 、 Dispersion (optics) 、 X-ray optics 、 Step-index profile 、 Interference (wave propagation) 、 Maxima 、 Optics 、 Physics 、 Wavelength 、 Reflection (physics)
摘要: An analysis of interference fringes (channel spectra) in transmission or reflection spectroscopy optical films can provide an accurate method for determining the refractive index thickness film. If is changing and common equation n = 1/(2tΔν) determined from positions two adjacent maxima pattern employed, resulting does not lie between correct values at frequencies as intuitively expected but well outside this range. This error be large restricted to previously discussed case with a linear dependence on wavelength.