Method of manufacturing a contact structure of an interconnection layer for a semiconductor device and a multilayer interconnection SRAM

作者: Osamu Sakamoto

DOI:

关键词: InterconnectionSiliconOptoelectronicsSemiconductor deviceConductivityMaterials scienceSilicidep–n junctionSpark plugElectronic engineeringLayer (electronics)

摘要: A silicon layer in a lower and an interconnection arranged upper are electrically connected through opening for contact. plug having the same conductivity type as that of is embedded opening. The by etch back method after deposited using CVD method. has different from layer. refractory metal silicide formed between prevents pn junction being

参考文章(22)
K. Tsutsumi, Y. Inoue, S. Murakami, O. Sakamoto, M. Ashida, Y. Kohno, A High-Performance Sram Memory Cell with Ldd-Tft Loads symposium on vlsi technology. pp. 23- 24 ,(1991) , 10.1109/VLSIT.1991.705971
Tat C. Choi, Richard K. Klein, Craig S. Sander, Four-transistor (4T) static ram cells ,(1987)
Shuichi Ohya, Masanori Kikuchi, Yoshitaka Narita, A New CMOS SRAM Cell with Fully Planarizing Technology symposium on vlsi technology. pp. 103- 104 ,(1987)
Jeffrey E. Brighton, Ronald E. McMann, Manuel L. Torreno, Michael T. Welch, Evaristo Garcia, Method for planarization of a semiconductor device prior to metallization ,(1987)