作者: Osamu Sakamoto
DOI:
关键词: Interconnection 、 Silicon 、 Optoelectronics 、 Semiconductor device 、 Conductivity 、 Materials science 、 Silicide 、 p–n junction 、 Spark plug 、 Electronic engineering 、 Layer (electronics)
摘要: A silicon layer in a lower and an interconnection arranged upper are electrically connected through opening for contact. plug having the same conductivity type as that of is embedded opening. The by etch back method after deposited using CVD method. has different from layer. refractory metal silicide formed between prevents pn junction being