Millimeter wave complex refractive index, complex dielectric permittivity and loss tangent of high purity and compensated silicon
作者： M.N. Afsar , H. Chi , X. Li
关键词: Permittivity 、 Absorption (electromagnetic radiation) 、 Dielectric 、 Dielectric loss 、 Optics 、 Semiconductor 、 Dissipation factor 、 Relative permittivity 、 Optoelectronics 、 Silicon 、 Materials science
摘要: … The complex refractive index, complex dielectric permittivity and loss tangent properties of three high resistivity silicon specimen including the highest resistivity silicon (… This silicon is the …
springer.com
sci-hub.se 参考文章(8)
M.N. Afsar, Dielectric Measurements of Millimeter-Wave Materials IEEE Transactions on Microwave Theory and Techniques. ,vol. 32, pp. 1598- 1609 ,(1984) , 10.1109/TMTT.1984.1132899
W F Passchier, D D Honijk, M Mandel, M N Afsar, A new method for the determination of complex refractive index spectra of transparent solids in the far-infrared spectral region: Results of pure silicon and crystal quartz Journal of Physics D. ,vol. 10, pp. 509- 517 ,(1977) , 10.1088/0022-3727/10/4/015
Mohammed Nurul Afsar, Precision millimeter-wave measurements of complex refractive index, complex dielectric permittivity, and loss tangent of common polymers IEEE Transactions on Instrumentation and Measurement. ,vol. 36, pp. 530- 536 ,(1987) , 10.1109/TIM.1987.6312733
M.N. Afsar, Precision Dielectric Measurements of Nonpolar Polymers in the Millimeter Wavelength Range IEEE Transactions on Microwave Theory and Techniques. ,vol. 33, pp. 1410- 1415 ,(1985) , 10.1109/TMTT.1985.1133232
M.N. Afsar, K.J. Button, Millimeter-wave dielectric measurement of materials Proceedings of the IEEE. ,vol. 73, pp. 131- 153 ,(1985) , 10.1109/PROC.1985.13114
Mohammed Nurul Afsar, Precision millimeter-wave dielectric measurements of birefringent crystalline sapphire and ceramic alumina IEEE Transactions on Instrumentation and Measurement. ,vol. 36, pp. 554- 559 ,(1987) , 10.1109/TIM.1987.6312739
D. D. Honijk, W. F. Passchier, M. N. Afsar, J. Goulon, Dispersive Fourier Transform Spectrometry with Variable-Thickness Variable-Temperature Liquid Cells IEEE Transactions on Microwave Theory and Techniques. ,vol. 25, pp. 505- 508 ,(1976) , 10.1109/ICSWA.1976.9349847
K. J. Button, M. N. Afsar, Millimeter-wave dielectric properties of materials IN: Infrared and millimeter waves. Volume 12 (A85-47960 23-31). Orlando. ,vol. 12, pp. 1- 42 ,(1984)